Separation analysis of low-concentration silica using a continuous flow analysis device (STAA-3)
A method has been devised to analyze silica contained in semiconductor materials, battery anodes, tantalum, niobium, steel, etc., with high sensitivity and simplicity! Materials available upon request.
In materials such as batteries and semiconductors, silica as an impurity can lead to a decrease in product performance, necessitating separation and analysis. Silica present in amounts exceeding a certain level in steel can be analyzed using the weight method specified by JIS, but this method has been complicated and has accuracy issues. Therefore, our company has devised a method to separate silica contained in samples as a gas, collect it in an absorbent solution, and measure it using molybdenum blue through a continuous flow analysis method. This document presents the results of our study titled "Investigation of Low Concentration Silica Separation and Analysis Using Continuous Flow Analysis Device (STAA-3) in Semiconductor Materials, Tantalum, Niobium, and Steel," in an easy-to-understand manner. *For more details, please refer to the download button. Feel free to contact us with any inquiries.
- Company：ビーエルテック
- Price：Other
